We have substantial expertise across a wide range of materials characterisation and modelling techniques. These include scanning electron microscopy (SEM), optical spectroscopy (absorption, (time-resolved) photoluminescence, transient absorption spectroscopy (TAS), x-ray diffraction (XRD), grazing-incidence wide-angle x-ray scattering (GIWAXS), electrochemical analysis). In particular, we have a state-of-the-art Atomic Force Microscope (AFM – Bruker Dimension ICON) with capabilities for piezoresponse force microscopy (PFM), conductive and photo-conductive AFM, Kelvin Probe Force Microscopy (KPFM), nanomechanical analysis. We also have expertise in Density Functional Theory, in particular for solid-state materials, photo-active materials, interfaces, and polar (ferroelectric) materials.
Du T, Richheimer F, Frohna K, Gasparini N, Mohan L, Min G, Xu W, MacDonald TJ, Yuan H, Ratnasingham SR, Haque S, Castro FA, Durrant JR, Stranks SD, Wood S, McLachlan MA and Briscoe J. “Overcoming Nanoscale Inhomogeneities in Thin-Film Perovskites via Exceptional Post-annealing Grain Growth for Enhanced Photodetection.” ACS Nano Letters.
Li X, Tu Y, Pace S, Anselmi-Tamburini U and Briscoe J. “Influence of ZnO nanorod surface chemistry on passivation effect of TiO2 shell coating.” IOP Journal of Physics D: Applied Physics.
Tu Y, Chen S, Li X, Gorbaciova J, Gillin WP, Krause S and Brisoce J. “Control of oxygen vacancies in ZnO nanorods by annealing and their influence on ZnO/PEDOT:PSS diode behaviour.” RSC Journal of Materials Chemistry C.